Q&A Others

 About far-field and near-field

 

Q1.

Can we obtain any field strength in order to compare it to the emission limit specified by the standard by converting in some form the data obtained by the NoiseKen EPS series EMC Precision Scan Systems? 

 

 Q2. Why are the NoiseKen EPS series EMC scanners offered with both of electric-field and magnetic-field probes?
 

 

 

 

 

Q1.

Can we obtain any field strength in order to compare it to the emission limit specified by the standard by converting in some form the data obtained by the NoiseKen EPS series EMC Precision Scan Systems?

 

 

Regrettably, such conversion is impossible.  However, this fact does not lessen the value of the EPS systems.  The far-field measurement required in many emission standards gives an absolute field strength and pass/fail result based on the value.  However, only near-field measurement can give information as to field intensity distribution over the scanned area. Also refer to Q2.

 

Q2.

 Why are the NoiseKen EPS series EMC scanners offered with both of electric-field and magnetic-field probes?

 

  Unlike the far-field measurements performed as the final compliance test, the fields produced in close proximity to the radiating source are highly dependent to its circuit properties.  It is important and useful, therefore, that the user can selectively use magnetic or field probes. Also refer to Q1.  
   
 
     
   
 
   

 

 

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