Can we obtain any field strength in order to compare it to the emission limit specified by the standard by converting in some form the data obtained by the Noiseken EPS series EMC Field Visualizationv Systems?
NoiseKenRegrettably, such conversion is impossible. However, this fact does not lessen the value of the EPS systems. The far-field measurement required in many emission standards gives an absolute field strength and pass/fail result based on the value. However, only near-field measurement can give information as to field intensity distribution over the scanned area.
