株式会社ノイズ研究所

Why are the Noiseken EPS series EMC Field Visualization Systems offered with both of electric-field and magnetic-field probes?

NoiseKen

Unlike the far-field measurements performed as the final compliance test, the fields produced in close proximity to the radiating source are highly dependent to its circuit properties.  It is important and useful, therefore, that the user can selectively use magnetic or field probes.

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