株式会社ノイズ研究所

Why are the Noiseken EPS series EMC Field Visualization Systems offered with both of electric-field and magnetic-field probes?

NoiseKen

Unlike the far-field measurements performed as the final compliance test, the fields produced in close proximity to the radiating source are highly dependent to its circuit properties.  It is important and useful, therefore, that the user can selectively use magnetic or field probes.

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    NoiseKen will be exhibiting at “Techno-Frontier 2024, the 37th EMC and Noise Countermeasures Technology Exhibition”.

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    New release of Impulse Noise Simulator INS-S100

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    Notice of discontinuation of LSS-6330 production

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