Impulse Noise Simulator¡¡INS-S220

Impulse Noise Simulator (Semiconductor Relay Type)¡¡INS-S220

To Solve the Real Trouble in the Market

Noise simulator can simulate high frequency noise generated ON/OFF at contact point of switch or relay,  arc caused by electric motor. It can evaluate the  resistibility of electric devices.
Pulse contains high frequency and by energy volume is changable by adjusting pulse width. The high reproduction noise test of noise trouble in the market can be conducted.

• Repetition cycle becomes faster. Due to high repetition, mal-function occurrence rate is up and test time is to be shortened.
• Pulse width setting becomes easier. : Just by pushing button, pulse width setting is available by 50ns step. Setting time and connection mistake can be reuced.
• Pulse waveform stability is improved, so high reproduction test is available.
• Cost is cut down because consuamable parts are reduced.
• Common mode/normal mode test is easily to switch by short plug.
• Wiring becomes easier because 50Ω resisitor is built in simulator.
• AC plug of EUT can be inserted directly by outlet panel.(option)
• Various tests are available by using different probes and coupling clamp.(option)
• EUT test with 3 phase 5 lines is available by external CDN.(option)

To solve the trouble in the market high frequency, energy volum of test pulse can be ajustable

Even narrow pulse with 50ns-100ns width contains less energy,  twice fast transient due to rise and fall and inducted coupling occurred by sharp electromagnetic field effect electric circuit greatly.
Wide pulse with 800ns-1000ns contains more energy, so voltage fluctuation is easily to effect circuit.
The rise time of impulse simulator is faster than IEC61000-4-4 fast transient/burst test, so spectrum is high. When it injects noise to EUT, noise is easier to invade electric circuit internally.
Spectrum and amplitude is different  due to Impulse width, so it is recommended to test with different pulse width.

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 Test reproduction is improved.¡¡More quantitative test is available.

The usual mercury relay changes into semiconductor relay, so test pulse stabability is improved. More quantitative and high reproduction test is available. Also, waveform distortion due to mercury relay's deterioration.

Mal-function rate is up. Test time is to be shortened.

The repetition of pulse in test is faster than the old product. Mal-function rate is up and test time is expected to be shortened.

Setting is simplified. Setting time is shortened.

It is troubesome to change the special coxial cables manually in old way. Setting time and connection mistake can be reduced because setting can be operated by button. requires for manually switch dedicated coaxial cables.

Cost is cut down. Consumable parts are reduced

We adopt semiconductor type relay instead of the mercuray relay in old type.
Also, cost on consumable exchange is reduced because pulse width setting cable (consumable) is no longer needed.

Connection is simplified. Connection time is shortened.

Outlet panel to which EUT is easyily to be connected is adopted.
EUT is easy to connect by using outlet panel (option) complying to each country's socket shape. 

Noise countermeasurement is easy. The malfunction generating position can be identified.

From power supply line, signal line, harness, enclosure to PCB, various noise  injection options are ready. The malfunction generating position is easy to identify.

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