Features

• Near Field Probe Model: LF1 set

  

  100 kHz ～ 50 MHz Magnetic Field

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  Near Field Probe Model: LF1 set

  

   

  The LF1 set is a set of 4 types of shielded probes for measuring magnetic fields from 100 kHz to 50 MHz on electronic assemblies.

  The probe head is designed for detection of single pins, larger components, and electromagnetic interference sources on the assembly. First, identify the large-scale sources with the LF-R 400 probe, and then use high-resolution probes such as LF-B 3, LF-U 5 and LF-U 2. 5 The magnetic field probe has a structure that suppresses the electric field component.

  *EPS-02Ev3 to be connect need conversion connector (MODEL: 02-00050A).

• Near Field Probe Model : RF1 set

  

  30 MHz ～ 3 GHz Electric Field/ Magnetic Field

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  Near Field Probe Model : RF1 set

  

  RF1 set is a set of 4 probes for measuring electric and magnetic fields from 30 MHz to 3 GHz on electronic assemblies. Each probe is suitable for measurements very close to the electronic assembly. Single IC pins, conductive paths, components to identify electromagnetic interference sources connect the connector and measure. By using these probes can check the direction of the magnetic field and the electric field distribution. The magnetic field probe has a structure that suppresses the electric field component.

  ※EPS-02Ev3 to be connect need conversion connector (MODEL:02-00050A) .

• Near Field Probe Model : RF2 set

  

  30 MHz ～ 3 GHz Magnetic Field

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  Near Field Probe Model : RF2 set

  

  RF2 set is a set of 4 probes for measuring magnetic fields from 30 MHz to 3 GHz on electronic assemblies. 

  The probe head can step through the sources of interference from the RF magnetic field on the assembly. Initially, RF-R 400-1 and RF-R 50-1 probes can be used to detect far-field electromagnetic interference. Next, the higher resolution RF-B 3-2 and RF-U 5-2 probes allow for more accurate detection of interferers. By using these probes, can check the direction of the magnetic field and the electric field distribution. The magnetic field probe has a structure that suppresses the electric field component.

  *EPS-02Ev3 to be connect need conversion connector. (MODEL:02-00050)

• Near Field Probe Model : RF3 mini set

  

  30 MHz ～ 3 GHz Magnetic Field

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  Near Field Probe Model : RF3 mini set

  

  The RF3 mini set are two probes with a resolution of 1 mm or less to measure the magnetic field of 30 MHz to 3 GHz on the electronic assembly at the development stage. The probe head is designed for measurements. These probes can be used to detect the directivity and distribution of the magnetic field on the electronic assembly. The probe has a sheath structure and shields the electric field component. And also recommend using a 20 dB or 30 dB preamplifier when measuring this probe.

   

  *EPS-02Ev3 to be connect need conversion connector. (MODEL:02-00050A)

• Near Field Probe Model : RF4-E set

  

  30 MHz ～ 3 GHz Electric Field

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  Near Field Probe Model : RF4-E set

  

  The RF4-E set is a set of two probes for measuring electric fields in the frequency range 30 MHz to 3 GHz. This probe detects the electric field by capacitive coupling and the steep rise and falls of the digital pulse of the signal pin (foot and lead) of the IC, and detects a sharp switching (voltage) component generated on the power supply pin of the IC. This probe has a function to suppress detection of current components (magnetic field components).

  *EPS-02Ev3 to be connect need conversion connector.
  (MODEL:02-00050A)

• Near Field Probe Model : XF1 set

  

  30 MHz ～ 6 GHz Magnetic Field

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  Near Field Probe Model : XF1 set

  

  The XF1set consists of four magnetic field probes and one E field probe, can measure within magnetic fields from 30 MHz to 6 GHz. The probe head enables step-by-step localization of magnetic field interference sources on the assembly. First, use the XF-R 400-1 probe to detect electromagnetic interference from a distance. Second, you can use a high-resolution probe to detect interference sources more accurately. E-field probes are used to detect electrical interference fields near the assembly. By using these probes, it is possible to detect the direction of the magnetic field and the electric field distribution on the electronic assembly. The magnetic field probe has a structure that suppresses the electric field component. 

  *EPS-02Ev3 to be connect need conversion connector.
  (MODEL:02-00137A)

• Near Field Probe Model : SX1 set

  

  1 GHz ～ 10 GHz Electric Field/ Magnetic Field

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  Near Field Probe Model : SX1 set

  

  The SX1 set consists of three passive type near-field probes for measuring magnetic fields and also magnetic fields with high clock frequencies of 1 GHz to 10 GHz on electronic components and ICs at development stage. The probe head allows measurements at distances very close to the electronic assembly. They can be placed on single IC pins, conductive paths, components and connectors to identify sources of interference. By using these probes, the direction of the magnetic field and the electric field distribution of the electronic assembly can be detected.

  *EPS-02Ev3 to be connect need conversion connector.
  (MODEL:02-00137A)