Emission Measurement Equipment (EPS) Conversion Connector Model : 02-00050A/137A
Conversion connector for connecting LANGER near field probe to EPS-02Ev3.
Specifications
| Model | Connector | Support Model |
|---|---|---|
| 02-00050A | N(P)-BNC(J) | LF1 set， RF1 set， RF2 set， RF3 mini set， RF4-E set， RF6 set |
| 02-00137A | N(P)-SMA(J) | XF1 set， SX1 set |
Contact
Repair, Inspection and Calibration
Customer Service CenterNew Purchase Consultation, Materials Request
Product Inquiry Form
Emission Measurement Equipment (EPS) Options
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Near Field Probe Model : LF1 set / RF1 set / RF2 set / RF3 mini set / RF4-E set / XF1 set / SX1 set
The EPS-02Ev3 system can be used in combination with various types of electromagnetic fi eld probes.
The electromagnetic fi eld probes introduced below are near-fi eld probes manufactured by LANGER, Germany, with various probes available for measurements ranging from a single pin level of parts to large components and assemblies.
We also off er probes for low frequencies and for measurements in higher frequency bands to use in combination with our EPS-02Ev3.
Please contact our sales representatives for detailed specifi cations of various near-fi eld probes and combination with EPS-02Ev3. -
Replacement Three Color Probe Head Cover MODEL : 03-00123A
Replacement probe head covers for the 3-color probe head cover set. -
Three Color Probe Head Cover MODEL : 03-00122A
A set of head covers for various probe tips. Attaching to the tip of the probe facilitates image recognition of the EPS-02 series camera.
The electromagnetic field probes can be stored in the case with the probe head covers attached, and unused probe cover heads can also be stored. -
Pre-amplifier MODELS : 00-00012A/14A/16A/19A
High-performance preamplifiers that can be used for various purposes including for the EPS-02 series. -
Electromagnetic Field Probes EM-6992
Related Products
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RSA306B can be used as standard for EPS-02EV3. -
Three-Dimensional Indication (Time, Frequency, Amplitude) Simplifies EMC/EMI Debugging
EPS is a EMC/EMI debugging tool enabling designers to rapidly perform pre-measurement, failure point identification, and improvement efficiency confirmation in EMC/EMI countermeasure process of product design.
How does it work? The software detects locations of probes by color discrimination through camera’s image sensors*, real time analysis measured signal frequency, shows a heat map by overlapping electromagnetic field strength and real images of measured objects.
*location detection method based on Patent Application 2007-223275 by National University Corporation Kanazawa University and Patent 5205547 by Noise Laboratory Co,. Ltd.
