Radiation Probes 01-00006A/07A/08A/09A/10A/30A/31A/50A
This probe is for connecting to our INS series, giving radiation noise due to electromagnetic fields to the wiring (PC board) inside the electronic device, and searching for the part that is vulnerable to the radiation noise of the electronic device.
- Magnetic field noise can be combined with wiring inside electronic devices.
- It is possible to test the parts inside electronic devices that are vulnerable to radiation noise.
- Target models: INS series FNS series
| Item | Specification |
| Input voltage | 4000V MAX |
| Input pulse width | 50ns 〜1μs |
| Loop diameter |
See the table below |
| Cable length | Approximately 2m |
| Weight | Approximately 180g 〜220g |
| Compatible connector | NMHV Tyoe |
| Model | Loop diameter |
| 01-00006A | φ 50mm |
| 01-00007A | φ 75mm |
| 01-00008A | φ 100mm |
| 01-00009A | φ 150mm |
| 01-00010A | φ 200mm |
| 01-00030A | φ300 mm |
| 01-00031A | φ250 mm |
| 01-00050A | φ 30 mm |
Test image
EMC-93
- 1EMS Probe Kit H2-B
- 2Noise application probe 01-00034A
- 3
- 4Coupling Adapter CA-805B
- 5Coupling Adapter CA-806（15-00007A)
- 6Outlet Panel(for S220） 18-00059C/60B/84A
- 7Injection unit IJ-4050
- 8USB Optical Module 07-00022A
- 9Coupling Clamp 15-00014A
- 10Pulse Application Cable
- 11Injection Proble for High Frequency Surge Resistance Test (0.01μF, 470 pF)
- 12INS Direct Injection Condenser 01-00047A
- 13Automatic CDN for impulse noise tester IJ-AT450
- 14Injection unit IJ-5100Z
