Features

• Features

  

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  ● Easy testing of circuit boards’ noise resistance due to the pulse output voltage from 50V.
  ● Easy noise immunity assessment due to possibility to change the output voltage during pulse output.
  ● “TEST TIME” setting available.
  ● Lightweight and compact due to no decoupling network (CDN) included.
  ● Test the noise resistance of signal lines using optional coupling adapters.
  ● Test the noise resistance of circuit boards using optional radiation probes.

  Parameter	INS-S100	INS-S220	INS-S420
  Pulse output voltage	0. 05kV ～ 1. 00kV	0. 50kV ～ 2. 00kV	0. 50kV ～ 4. 00kV
  Pulse width	50ns ～ 1000ns	100ns ～ 1000ns ※output voltage：～ 0. 99kV 50ns ～ 1000ns ※output voltage：1. 00kV ～	50ns ～ 1000ns
  Repetition cycle	10ms ～ 999ms	1ms ～ 999ms ※output voltage：～ 0. 99kV 10ms ～ 999ms ※output voltage：1. 00kV ～	10ms ～ 999ms
  Rise time	＜ 3ns ※ when 50Ω terminated	＜ 3ns ※ when 50Ω terminated	＜ 3ns ※ when 50Ω terminated
  Decoupling network (CDN)	none	equipped	equipped

  Output waveform image

  

• Improve the Product Quality ! Choose the application method best suiting your testing purpose

  

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  The purpose of noise resistance testing is to ensure a certain level of social safety by clearing the limits of international and industry standards, and to improve product quality by confirming and reproducing malfunctions occurring in the market. Generally, impulse noise testing is performed by injecting noise into the power supply system to check the product’s noise resistance, but resistance can also be tested on circuit boards by the application method according to the purpose. You can easily test the noise immunity by clamping the coupling adapter to the signal cable and applying the voltage, or by using a radiation probe to identify the malfunction location due to the near magnetic field on the circuit board.

  

   

  Noise immunity testing with Impulse Noise Simulator

  

• To solve the trouble in the market Test pulse with adjustable high frequencies and energy volume

  

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  Narrow pulse of 50-100ns width although contains small energy, greatly affects electric circuits due to two transient fluctuations of short-time rise and fall and inductive coupling by steeply generated electromagnetic field.
  Wide pulse of 800ns-1000ns contains more energy, making it easy to apply large voltage fluctuations to the circuit.
  The rise time of impulse simulator is faster than IEC61000-4-4 fast transient/burst test and contains high frequency components up to 1GHz.
  Therefore, when noise is applied to the EUT, it is easier to penetrate and affect the electronic circuit.
  In addition, since the included frequency spectrum components and intensity differ depending on the pulse width of the impulse, it is recommended to conduct tests with several types of pulse widths.
  

• Easy Noise countermeasurement Identify the malfunction location

  

  A large number of noise application options are available for power lines, communication lines, harnesses, housings, and board levels, making it easy to identify malfunction locations.

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  A large number of noise application options are available for power lines, communication lines, harnesses, housings, and board levels, making it easy to identify malfunction locations.