This product is no longer manufactured or sold.
Product body (Discontinued) DC Power Supply Voltage Fluctuation Simulators SG-7040A System
Simulator to reproduce power supply voltage fluctuation to electronics devices in a vehicle and evaluate the immune resistibility against the fluctuation.
Max. 4 channels not only +B connection but also ACC, IG (and IG2), etc. can be synchronized for the reproduction.
Features
Features
read more- ISO 16750 Standard compliant test (Possible to respond to private standards of the manufacturers).
- High resolution and high accuracy for the waveforms output realized with waveforms operation circuits built in the each channel.
- Easy and precise reproduction of the fluctuation phenomena not only in the Standard but also arbitrarily enabled with the software control (USB).
- Insures less than 1μs for the synchronizing variation among the channels.
- Enable to reproduce waveforms by using CSV data collected from real vehicle oscilloscope measurements.
- Automated testing operation can be customized for reducing the man-hour.
*Please contact us for the specification details.
*Load dump test A and B pulses not availableSpecifications
read more
The system is primarily comprised of the following three elements: multi-channel signal generator, bipolar power
source(s), and arbitrary waveform creation software.
Appropriate bipolar power sources shall be selected and the multi-channel signal generator shall be configured
according to test requirements.1. Multi-channel signal generator ・Modular construction for a maximum of four channels
・Arbitrary waveform creation (DC, ramp wave, sine wave, exponential wave, frequency modulation, amplitude modulation)
・Waveform sequence creation2. Arbitrary Waveform Creation Software The arbitrary waveform creation software easily creates complicated waveforms with repeated voltage and time ramping with its superb GUI. 3. Bipolar Power Source High-speed bipolar power source is selected according to the DUT power rating. Software
read more
Multi-channel signal generator SG-7040A
read more
Sweep Setting Function
read more
Easily and reliably creates a loop waveform using the sweep function detailed at left for a long test duration requiring varying T (times) and V (voltages).
T (ε) = Start
Te (ε) = Stop
Ut (ε) = Step
N = Loop Number
LP = Loop SettingDelay Set Function
read more
In multichannel tests it is important to ensure each individual channel is precisely synchronized. This system guarantees a synchronization delay of 1μs or less by compensating for output timing differences from the power amplifiers being connected, whereas other systems are not equipped with similar capability, which often leads to a erroneous test.
CSV Waveform EXCEL Operation Example
read more
Imports non-standard test waveforms such as waveforms data collected in vehicle environments as CSV files, and generates these waveforms from the signal generator. Not available thus far with existing conventional equipment due to the limited memory capacity , the SG-7040A with 512 k words memory is a perfect solution to accurately perform complex voltage variations, fluctuations, dips and dropouts.
Automated Simulations
read more
■ Example 1: CAN Communication Control
CAN is one of the most widely adopted system bus in automotive technology. Automated testing can be done by reading CAN communication protocols into the software and defining malfunction of the DUT.
■ Example 2: “Dark Current” Measurement
Some automobile manufacturers implement “Dark Current” measurements. This system allows dark current measurements in conjunction with voltage fluctuation simulations.
■ Example 3: Check Device
Automated testing by incorporating Pass/Fail judgment circuit with received signals from the DUT such as voltage, current, and frequency.
ポップアップタイトル
closeSpecifications
| Parameter | Specifications / Functions |
|---|---|
| Channel Number | 1 ch 〜 4 ch |
| Oscilloscope Trigger Output | BNC Connector 0 〜 5 V Set the desired point as the trigger point with the waveform creation software and monitor waveform generation with the external trigger function of the oscilloscope. |
| Waveform Generator Method | Sampling waveform output based on partial waveform memory and DSP circuit output CSV data |
| Output Voltage | 0.00 〜 ± 6.00 V |
| Output Current | 5 mA Max. |
| Output Impedance | 50 Ω |
| Setting Resolution | 0.01 V |
| Output Resolution | 1.221 mV |
| Offset Voltage | ± 6.0 V |
| Frequency Response | 150 kHz Max. (± 6.00 V Amplitude Sine Wave) |
| Characteristics | 150 kHz Max. (± 6.00 V Square Sine Wave) |
| Frequency Precision | ± 20ns + 50 ppm (over the entire frequency rang) |
| Waveform Rise / Fall Time | Less than 100ns (0±1.00V Swing) |
| Slew Rate | 20 V /μs |
| Synchronization accuracy | Adjustable at a step of 1.0uS up to 10uS, to compensate differences in response time of the amplifiers connected. Synchronization with <1.0uS accuracy at the outputs of the bipolar power amplifiers connected. |
| Calibration Output | 1 kHz 1V (Test Use) |
| PC Interface | USB 1.1 |
| Operating Temperature | 25℃ ±10℃ |
| Operating Humidity | 20 〜 90% RH |
| Drive Power Source | Local AC supply voltage ±10% 50 / 60Hz 15 VA |
| External Dimensions | approx. (W)430 x (D)400 x (H)200 mm |
| Weight | approx. 10 kg |
■Accessories
| Item | Q'ty |
|---|---|
| Coaxial cable (BNC-BNC/2m) | For number of channel |
| Output cable (1m) | For number of channel |
| Crimping terminal (M4) | For number of channel × 2 pcs. |
| Crimping terminal (M6) | For number of channel × 2 pcs. |
| Crimping terminal (M8) | For number of channel × 2 pcs. |
| Fuse (3.15A) | 1 pc. |
| Application software | 1 pc. |
| AC cable | 1 pc. |
| USB cable | 1 pc. |
| Instruction manuals (for main unit and software operation) | Each 1 volume |
| Accessories bag | 1 pc. |
Contact
Repair, Inspection and Calibration
Customer Service CenterNew Purchase Consultation, Materials Request
Product Inquiry Form
Related Products
-
EPS-02EMFv2 can save the frequency data of the measured magnetic field, so you can easily identify the countermeasure points.
EPS-02Hv2 can directly read and visualize the data from the magnetic field sensor measurement part. It is very compact and easy to carry, and is convenient for on-site measurement. -
System rack that all pulse generating units can be mounted on (ISS-7602).
ISS-7690 Coupling Network unit centralizes all pulse outputs of the system-configured generators in the single output port. -
The ISO 7637-3 2007 standard provides evaluation of the immunity of devices under test (DUTs) to transient transmission by coupling via lines other than supply lines. The test transient pulses simulate both fast and slow transient disturbances, such as those caused by the switching of inductive loads and relay contact bounce. Also it provides 3 kinds of the coupling methods. -
Pulse 5a : Simulation of load dump transient, occurring in the event of a discharged battery being disconnected while the alternator is generating charging current and with other loads remaining on the alternator circuit at this moment.
Pulse 5b : Simulation of the above load dump transient when a Zener diode is inserted to the battery route. -
Simulation of transients which occur as a result of the switching processes. The characteristics of these transients are influenced by distributed capacitance and inductance of the wiring harness. -
Pulse 1 : Simulation of transients due to supply disconnection from inductive loads. It is applicable to DUTs which, as used in the vehicle, remain connected directly in parallel with an inductive load.
Pulse 2a : Simulates transients due to sudden interruption of currents in a device connected in parallel with the DUT due to the inductance of the wiring harness -
This tester simulates various transient surge phenomenon noise in vehicles required by the international standard ISO 7637-2 (2011 version) and evaluates the resistance of on-board electronic devices. -
This simulator for evaluation of the resistance of electronic devices simulates "high-energy in-duced lightning noise" induced in distribution lines and communication lines due to the ground potential fluctuations caused by lightning strikes. -
