Simulator to reproduce power supply voltage fluctuation to electronics devices in a vehicle and evaluate the immune resistibility against the fluctuation.
Max. 4 channels not only +B connection but also ACC, IG (and IG2), etc. can be synchronized for the reproduction.

System rack that all pulse generating units can be mounted on (ISS-7602).
ISS-7690 Coupling Network unit centralizes all pulse outputs of the system-configured generators in the single output port.

The ISO 7637-3 2007 standard provides evaluation of the immunity of devices under test (DUTs) to transient transmission by coupling via lines other than supply lines. The test transient pulses simulate both fast and slow transient disturbances, such as those caused by the switching of inductive loads and relay contact bounce. Also it provides 3 kinds of the coupling methods.

Pulse 5a : Simulation of load dump transient, occurring in the event of a discharged battery being disconnected while the alternator is generating charging current and with other loads remaining on the alternator circuit at this moment.
Pulse 5b : Simulation of the above load dump transient when a Zener diode is inserted to the battery route.

Simulation of transients which occur as a result of the switching processes. The characteristics of these transients are influenced by distributed capacitance and inductance of the wiring harness.

Pulse 1 : Simulation of transients due to supply disconnection from inductive loads. It is applicable to DUTs which, as used in the vehicle, remain connected directly in parallel with an inductive load.
Pulse 2a : Simulates transients due to sudden interruption of currents in a device connected in parallel with the DUT due to the inductance of the wiring harness

This simulator for evaluation of the resistance of electronic devices simulates "high-energy in-duced lightning noise" induced in distribution lines and communication lines due to the ground potential fluctuations caused by lightning strikes.