The DPI immunity test method is an immunity evaluation method for semiconductors (IC) standardized by IEC standards.
This test evaluates immunity by directly injecting RF interference power into the IC power supply on the test board on which the IC to be evaluated is mounted.
In the test, it is necessary to gradually increase the test level (power) for each test frequency and check the performance of the IC each time.
In addition, when a malfunction occurs, it is necessary to record the status of the malfunction, which takes a lot of time and effort.
The NoiseKen's DPI immunity test system performs tests from the start of the test to malfunction determination consistently. This is a revolutionary automation system that saves test time and testers' hands. |
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2020/2/18 9:23 
